His current interests cover the field of device physics and defect engineering in general, with particular emphasis on the study of low-frequency noise, low-temperature behavior and of radiation defects in semiconductor components and materials. He is an Imec Senior Researcher, currently involved in the study of defect and strain engineering in high-mobility and epitaxial substrates and defect studies in germanium and III-V compounds (AlN; GaN, InP...). Another current focus point is the study of 1-transistor memories based on bulk FinFET and Ultra-thin Buried Oxide (UTBOX) Silicon-on-Insulator (SOI), using low-frequency noise. In 2013, he was nominated part-time Professor at the Ghent University in the field of the study on the impact of defects on semiconductor devices. In 2016 he became a Fellow of the Electrochemical Society. Since November of 2016 he is the Chair of the IEEE EDS Chapter Benelux.