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论文共 8 篇作者统计合作学者相似作者

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Single Event Effects and Total Ionizing Dose Characterization of MNEMOSYNE STT MRAM Prototype with 1.8V SPI Interface
Simone Gerardin,Marta Bagatin,Pierre-Xiao Wang,Pierre Kohler,Alexandre Bosser,Lionel Gouyet, Gael Vignon, Paul Zuber,Geert Thys
2024 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2024 NSREC)pp.1-4, (2024)
引用0浏览0EIWOS引用
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Radiation-Hardened Space STT MRAM on FDSOI Process Test Results
Pierre-Xiao Wang,Pierre Kohler,Alexandre Bosser, Mickaël Foucher,Simone Gerardin,Marta Bagatin,Lionel Gouyet, Gaël Vignon, Paul Zuber,Geert Thys
2023 RADECS Data Workshoppp.1-4, (2023)
引用0浏览0EIWOS引用
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List of Papers
David M. Hiemstra,Alvin J. Boutte,Donna J. Cochran, Dakai Chen,Michael J. Campola, Jonathan A. Pellish,Ray Ladbury,Edward P. Wilcox,Jean‐Marie Lauenstein,Robert A. Gigliuto, Kenneth A. LaBel, M. Mehdi Owrang O.,Tom Fairbanks,Heather Quinn,Justin L. Tripp,John Michel,Adam Warniment, Nick Dallmann,Martha V. O'Bryan,Megan C. Casey,Alyson D. Topper,Melanie D. Berg, Robert Davies,Vasily S. Anashin,А. С. Кузнецов, Alexander E. Kozyukov,Linaris R. Bakirov,Anatoly A. Kazyakin,Kirill A. Artemyev, Giovanni Spiezia,Markus Brugger,Salvatore Danzeca, Garcia Alia, R. Gaillard, Eleftherios Fadakis,G. Foucard,R. Losito, A. Masi,Julien Mekki,Pascal Oser, C. López-Ongil, G. Ruggiero,R. Secondo, Sławosz Uznański,Benjamin Todd,A. Dinius,Q. King, Karol Motala,E Gousiou,Marc Poizat, Maryse Sauvagnac,A. Samaras, Yannick Padié, Enric García-Caurel, Benjamin Renaud,Lionel Gouyet, Jean Paul Abadi, Fabien Widmeer, Enoal Le Goulven,M. Vaille,B. Vandevelde, Thomas Caunes, Ludovic Puybusque, Gaël Vignon, Lionel Salvy, A. Rousset,C. Chatry, C. Erd,C. Poivey, Frédéric Wrobel,Cesar Boatella-Polo,Ali Zadeh,Ryan Kingsbury, F. Schmidt,W Blackwell, I. Osarentin, Robert T. Legge,Kerri Cahoy, Devon Sklair, S. M. Guertin, Gregory Allen, S. McClure,Vincent Lam,Valeri Kirischian,Roberto Monreal, G.M. Swift, Yipeng Wang,Michael Wirthlin, Brent Nelson, Bong Wie, Mark Plante, Antwong Berkley, R. Ghasemi Nejad, Andrea Manuzzato, Alexander Harding,Kevin Ellsworth, Steven A. Rogacki,Steven C. Persyn,Paul W. Marshall, John Stone, F. Irom, Duc Nguyen,Timothy R. Oldham,M. Friendlich, Nicolaas van Vonno,Bryan R.G. Williams,Ralph W. Hood, Elizabeth Thomson, Susan L. Bernard, S. D. Turner, S Schulte, Larry P. Gough, J. E. Shick,T. J. Thornton, William Lepkowski, Seth J. Wilk,Michael Goryll, Bo Chen,Jason Kam, Bertan Bakkaloğlu,Keith E. Holbert,Razvan Gaza, Jaime Cooper, R. Koga, Charles W. Paul, D Romeo, Vahan Petrosyan, J. George,Stephen E. Stone, A. Bogorad,Justin J. Likar,Robert E. Lombardi, Roman Herschitz,Kirby Kruckmeyer,Thang Trinh, Linton Park, David Kerwin,Younes Lotfi, A. Zanchi, Kenneth G. Merkel, Anthony Wilson, C. Hafer, F. Toscano, A. Ouellet,F. Tilhac, T. Lagarrigue, Robert M. Moision, Arturo Arroyo,R. Marec,Alan Bensoussan, Jean‐Luc Muraro, L Portal,P. Calvel,Christian Barillot, Marie-Geneviève Périchaud,Loı̈c Le Marchand, Anthony M. Phan,Hak Kim, Richard C. Benson, Paul Resch,Randall Milanowski,Carl M. Szabo,Martin A. Carts,Matthew Kay, Timothy J. Sinclair, Matthew J. Gadlage,Adam R. Duncan, Dave Ingalls, Sdram Devices,Martin Herrmann,Kai Grürmann, F. Gliem,H. Schmidt,Jakub Hofman,Leif Scheick,Larry D. Edmonds, John Bird, David Duval,Forrest Gasdia, Charlie Hamp,Richard Horton, T. Koval,Jennifer Lee, Kristin Marino, Timothy O’Connor, S. Rezgui
openalex（2013）
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Evaluation on Protective Single Event Burnout Test Method for Power Dmosfets
Sandra Liu,Ronan Marec, Phillip Sherman,Jeffrey L. Titus,Francoise Bezerra, Veronique Ferlet-Cavois, Marc Marin,Nicolas Sukhaseum, Fabien Widmer,Michele Muschitiello,Lionel Gouyet,Robert Ecoffet,Max Zafrani
IEEE TRANSACTIONS ON NUCLEAR SCIENCEno. 4 (2012): 1125-1129
引用8浏览0EIWOS引用
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作者统计

#Papers: 8

#Citation: 44

H-Index: 3

G-Index: 5

Sociability: 5

Diversity: 1

Activity: 0

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