A Summary of Single Event Upset Testing of CD4000 Series Devices

Robert E. Lombardi,Alexander L. Bogorad,Justin J. Likar, Aaron S. Rubin, Carlos F. Camacho

2011 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW)（2011）

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Key words

CMOS digital integrated circuits,integrated circuit testing,CD4000 Series Devices,CMOS digital devices,CMOS quad 2-input NAND gate,CMOS quad bilateral switch,CMOS ripple-carry binary counter,HCC4011 device,HCC4013 device,HCC4020B device,HCC4066 device,single event upset testing

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