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SEE Characterization of the AMS 0.35 Μm CMOS Technology

J. Ramos,A. Arias, J. M. Mora, M. Munoz,A. Ragel, B. Pinero, J. Ceballos,L. Carranza, S. Sordo, M. A. Lagos,S. Espejo

2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS)(2013)

Cited 24|Views0
Key words
aerospace electronics,mixed-signal ASICs,radiation hardening,single-event effects
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