Precision Measurement of Charged Pion and Kaon Differential Cross Sections in E(+)E(-) Annihilation at Root S=10.52 Gev
M. Leitgab,R. Seidl,M. Grosse Perdekamp,A. Vossen,I. Adachi,H. Aihara,D. M. Asner,V. Aulchenko,T. Aushev,A. M. Bakich,B. Bhuyan,A. Bondar,A. Bozek,M. Bracko,J. Brodzicka,T. E. Browder,V. Chekelian,A. Chen,P. Chen,B. G. Cheon,K. Chilikin,K. Cho,V. Chobanova,Y. Choi,D. Cinabro,J. Dalseno,Z. Drasal,D. Dutta, S. Eidelman,D. Epifanov,H. Farhat,J. E. Fast,V. Gaur,N. Gabyshev,R. Gillard,F. Giordano,Y. M. Goh,B. Golob,J. Haba,K. Hayasaka,H. Hayashii,Y. Hoshi, W. -S. Hou,Y. B. Hsiung,H. J. Hyun,T. Iijima,A. Ishikawa,R. Itoh,W. W. Jacobs,T. Julius,J. H. Kang,P. Kapusta,E. Kato,T. Kawasaki,H. J. Kim,H. O. Kim,J. B. Kim,J. H. Kim,M. J. Kim,J. Klucar,B. R. Ko,P. Kodys,R. T. Kouzes, P. Krizan,P. Krokovny,R. Kumar,T. Kumita,Y. -J. Kwon,J. S. Lange,S. -H. Lee,Y. Li,Z. Q. Liu,D. Liventsev,D. Matvienko,K. Miyabayashi,H. Miyata,R. Mizuk,A. Moll,N. Muramatsu,E. Nakano,M. Nakao,Z. Natkaniec,M. Nayak,E. Nedelkovska,C. Ng,N. K. Nisar,O. Nitoh,A. Ogawa,S. Ogawa,T. Ohshima,S. Okuno,S. L. Olsen,C. Oswald,P. Pakhlov,H. Park,H. K. Park,T. K. Pedlar,R. Pestotnik,M. Petric,L. E. Piilonen,M. Roehrken,H. Sahoo,Y. Sakai,S. Sandilya,L. Santelj,T. Sanuki,Y. Sato,O. Schneider,G. Schnell,C. Schwanda, K. Senyo,O. Seon,M. E. Sevior,M. Shapkin,C. P. Shen,T. -A. Shibata,J. -G. Shiu,B. Shwartz,A. Sibidanov,F. Simon,P. Smerkol,Y. -S. Sohn,A. Sokolov,E. Solovieva,M. Staric,M. Sumihama,T. Sumiyoshi,G. Tatishvili,Y. Teramoto,T. Tsuboyama,M. Uchida,T. Uglov,Y. Unno,S. Uno,Y. Usov,C. Van Hulse,G. Varner,V. Vorobyev,M. N. Wagner,C. H. Wang,J. Wang,M. -Z. Wang,P. Wang,M. Watanabe,Y. Watanabe, K. M. Williams,E. Won,Y. Yamashita,V. Zhilich,V. Zhulanov
Physical Review Letters（2013）
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