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Test Beam Evaluation of Newly Developed N-in-p Planar Pixel Sensors for Use in a High Radiation Environment

K. Kimura,D. Yamaguchi,K. Motohashi,K. Nakamura,Y. Unno,O. Jinnouchi,S. Altenheiner,A. Blue,M. Bomben, A. Butter,A. Cervelli,S. Crawley,A. Ducourthial,A. Gisen,M. Hagihara,K. Hanagaki,K. Hara,M. Hirose,Y. Homma,Y. Ikegami,S. Kamada,T. Kono,A. Macchiolo,G. Marchiori,F. Meloni,M. Milovanovic,A. Morton,G. Mullier,F. J. Munoz,C. Nellist,B. Paschen,A. Quadt,T. Rashid,J. Rieger,A. Rummler,K. Sato,N. Savic,H. Sawai, K. Sexton,M. E. Stramaglia,M. Swiatlowski,R. Takashima,Y. Takubo,S. Terzo,K. Todome,J. Tojo, K. Van Houten,J. Weingarten,S. Wonsak,K. Wraight,K. Yamamura

Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment（2016）

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Key words
Pixel detector,N-in-p,Radiation hardness,Bulk damage,Surface damage,Bias structure
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