Channeling, Volume Reflection, and Volume Capture Study of Electrons in a Bent Silicon CrystalT. N. Wistisen,U. I. Uggerhoj,U. Wienands,T. W. Markiewicz,R. J. Noble, B. C. Benson,T. Smith,E. Bagli,L. Bandiera,G. Germogli,V. Guidi,A. Mazzolari,R. Holtzapple,S. TuckerPhysical Review Accelerators and Beams（2016）引用 42|浏览24AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
