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Impact of Multiple Write Cycles on the Radiation Sensitivity of NAND Flash Memory Devices

B. Vandevelde,N. Chatry,N. Sukhaseum,J. Guillermin,L. Gouyet,A. Rousset, R. Gaillard,D. Dangla,E. Lorfevre

2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS)（2016）

Cited 2|Views3
Key words
Data corruption,NAND Flash memory,SEU sensitivity,TID testing
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