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Experimental Comparative Analysis Between Junctionless and Inversion Mode Nanowire Transistors Down to 10 Nm-Long Channel Lengths

2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)(2017)

Cited 1|Views40
Key words
Junctioless transistors,Undoped Nanowires,SOI Technology,DIBL,Subthreshold swing,Transconductance
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