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Radiation Hardness Studies on a Novel CMOS Process for Depleted Monolithic Active Pixel Sensors

Enrico Junior Schioppa,Richard Bates,Craig Buttar,Marco Dalla,Jacobus Willem Van Hoorne,Thanushan Kugathasan,Dzmitry Maneuski,Cesar Augusto Marin Tobon,Luciano Musa,Heinz Pernegger,Petra Riedler,Christian Riegel,Carla Sbarra, Douglas Michael Schaefer,Abhishek Sharma,Walter Snoeys,Carlos Solans Sanchez

2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)（2017）

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