Effect of Gamma Irradiation on Leakage Current in Cmos Readout Chips for the Atlas Upgrade Silicon Strip Tracker at the Hl-Lhc
2017 IEEE NUCLEAR SCIENCE SYMPOSIUM AND MEDICAL IMAGING CONFERENCE (NSS/MIC)（2017）
Key words
leakage current,CMOS readout chips,ATLAS upgrade silicon strip tracker,HL-LHC,ATLAS inner tracker,High Luminosity upgrade,CERN laboratory,60 Co gamma source,Brookhaven National Laboratory,digital leakage,total ionizing dose,High Luminosity LHC,Rutherford Appleton Laboratory,pre-irradiated devices,pre-irradiated chips,detector readout chips,gamma irradiation effect,CMOS technologies,power dissipation,ABC130 readout chips,temperature 10.0 degC
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