Developments in the FBK Production of Ultra -Fast Silicon Detectors
2017 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)（2017）
关键词
FBK production,Ultra-fast Silicon Detectors,Fondazione Bruno Kessler,UFSD sensors,doping profile configurations,controlled multiplication mechanism,radiation hard technology,high-radiation environments,gain layer,Silicon substrate,high resistivity Silicon,size 300 mum
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