Absolute calibration of microchannel plate detector for carbon ions up to 250 MeV

Aodhan McIlvenny,Domenico Doria,Lorenzo Romagnani,Hamad Ahmed,Philip Martin,S. D.R. Williamson,E. J. Ditter,O.C. Ettlinger,G. Hicks,P. Mckenna,Zulfikar Najmudin,D. Neely,Satyabrata Kar,Marco Borghesi

JOURNAL OF INSTRUMENTATION（2019）

引用 7|浏览59

关键词

Ion sources (positive ions, negative ions, electron cyclotron resonance (ECR), electron beam (EBIS)),Plasma diagnostics - charged-particle spectroscopy

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