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Sensor Reliability Assessment Model and Cost Analysis : ER: Equipment Reliability and Productivity Enhancements

Bridget Boland,Gregory Denbeaux,Eric Eisenbraun, Michael Fancher

2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)(2019)

Cited 0|Views4
Key words
Electrochemical sensors,Weibull analysis,Reliability testing,Censored data
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