Interstrip Capacitances of the Readout Board Used in Large Triple-Gem Detectors for the CMS Muon Upgrade

M. Abbas,M. Abbrescia,H. Abdalla,A. Abdelalim,S. AbuZeid,A. Agapitos,A. Ahmad,A. Ahmed,W. Ahmed,C. Aime,C. Aruta,I Asghar,P. Aspell,C. Avila,J. Babbar,Y. Ban,R. Band,S. Bansal,L. Benussi,V Bhatnagar,M. Bianco,S. Bianco,K. Black,L. Borgonovi,O. Bouhali,A. Braghieri,S. Braibant,S. Butalla,S. Calzaferri,M. Caponero,F. Cassese,N. Cavallo,S. Chauhan,A. Colaleo, J. Collins,A. Conde Garcia,M. Dalchenko,A. De Iorio,G. De Lentdecker,D. Dell Olio,G. De Robertis,W. Dharmaratna,S. Dildick,B. Dorney,R. Erbacher,F. Fabozzi,F. Fallavollita,A. Ferraro,D. Fiorina,E. Fontanesi,M. Franco,C. Galloni,P. Giacomelli,S. Gigli,J. Gilmore,M. Gola,M. Gruchala,A. Gutierrez,R. Hadjiiska,T. Hakkarainen,J. Hauser,K. Hoepfner,M. Hohlmann,H. Hoorani,T. Huang,P. Iaydjiev,A. Irshad,A. Iorio,F. Ivone,J. Jaramillo,D. Jeong,V Jha,A. Juodagalvis,E. Juska,B. Kailasapathy,T. Kamon,P. Karchin,A. Kaur,H. Kaur,H. Keller,H. Kim,J. Kim,A. Kumar,S. Kumar,H. Kumawat,N. Lacalamita,J. S. H. Lee,A. Levin,Q. Li,F. Licciulli,L. Lista,K. Liyanage,F. Loddo,M. Lohan,M. Luhach,M. Maggi,Y. Maghrbi,N. Majumdar,K. Malagalage,S. Malhotra,S. Martiradonna,N. Mccoll,C. McLean,J. Merlin,M. Misheva,D. Mishra,G. Mocellin,L. Moureaux,A. Muhammad,S. Muhammad,S. Mukhopadhyay,M. Naimuddin,P. Netrakanti,S. Nuzzo,R. Oliveira,L. Pant,P. Paolucci,I. C. Park,L. Passamonti,G. Passeggio,A. Peck,N. Perera,L. Petre,H. Petrow,D. Piccolo,D. Pierluigi,G. Raffone,M. Rahmani,F. Ramirez,A. Ranieri,G. Rashevski,M. Ressegotti,C. Riccardi,M. Rodozov,E. Romano,C. Roskas,B. Rossi,P. Rout,D. Roy,J. D. Ruiz,A. Russo,A. Safonov,D. Saltzberg,G. Saviano,A. Shah,A. Sharma,R. Sharma,M. Shopova,F. Simone,J. Singh,E. Soldani,U. Sonnadara,E. Starling,B. Stone,J. Sturdy,G. Sultanov,Z. Szillasi,D. Teague,D. Teyssier,T. Tuuva,M. Tytgat,I Vai,N. Vanegas,R. Venditti,P. Verwilligen,W. Vetens,A. Virdi,P. Vitulo,A. Wajid,D. Wang,K. Wang,Ij Watson, J. Weatherwax,N. Wickramage,D. D. C. Wickramarathna,Y. Yang,U. Yang,J. Yongho,I Yoon,Z. You,I Yu,S. Zaleski

Journal of Instrumentation（2020）

Cited 1|Views78

Key words

Detector modelling and simulations II (electric fields, charge transport, multiplication and induction, pulse formation, electron emission, etc),Micropattern gaseous detectors (MSGC, GEM, THGEM, RETHGEM, MHSP, MICROPIC, MICROMEGAS, InGrid, etc)

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