Electron Energy Loss Spectroscopy of Extended Defects

U Bangert,A Gutierrez-Sosa,A Harvey,R Jones,CJ Fall,A Blumenau,R Briddon

ELECTRON MICROSCOPY AND ANALYSIS 2003（2004）

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关键词

Environmental Scanning Electron Microscopy,Scanning Electron Microscopy,Secondary Electron Emission,X-ray Photoelectron Spectroscopy,Ambient Pressure Photoelectron Spectroscopy

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