Causes of the Difference Between Hall Mobility and Field-Effect Mobility for P-Type RF Sputtered Cu₂O Thin-Film Transistors
IEEE Transactions on Electron Devices（2020）
Key words
Copper oxide (CuOX),cuprous oxide (Cu2O),p-type oxide semiconductor,thin-film transistor (TFT)
AI Read Science
Must-Reading Tree
Example
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined