Ptychography and Single-Shot Nanoscale Imaging with Plasma-Based Laser Sources

We report the direct wavefront characterization of an intense ultrafast high-harmonic seeded soft X-ray laser at 32.8 nm wavelength and monitor the exit of the laser plasma amplifier depending on the arrival time of the seed pulses with respect to pump pulses. For the wavefront measurement in phase and intensity, we used high-resolution ptychography. After propagating the wavefront back to the source, we are able to observe the rear end of the plasma amplifier. We compare the characteristics of the seeded soft X-ray Laser to an unseeded one and find an increasing beam stability and lateral coherence important for lensless imaging techniques.