Measurement of CP Violation Parameter Sin** 2(phi(1)) with 152 Million B Anti-B Pairs
Kazuo Abe,Yuan Chao,S. Kobayashi,D. Žontar,D. Liventsev,R. Kulasiri,S. Vahsen,D. Epifanov,S. Stanič,Yusuke Asano,H. Kichimi,G.R. Moloney,V. Zhilich,Y.-J. Kwon,H. Shibuya,Y. Miyabayashi,M. Akatsu,S. Uehara,Junichi Tanaka,S.L. Olsen,K. Suzuki,D.W. Kim, Santosh Kumar,T. Uglov,H. Kakuno,M. Peters,M. Asai,Minoru Tanaka,Y. Choi,Takashi Mori,Megumi Shimoyama,Saburou Saitoh,S.H. Lee,N. Katayama,K. Hoshina,H. Park,R. Dowd,T. Sumiyoshi,S. Okuno,J. Brodzicka,T. Igaki,J.W. Nam,F. Takasaki,B.G. Cheon,Z.P. Zhang,H. Miyake,K. Yoshida,H. Ishino,T. Tsuboyama, J. Zhang,K.F. Chen,A. Ogawa,B. Golob,T. Iijima,A. Ishikawa,J.S. Lange,A. J. Schwartz,M. Iwasaki,R. Guo,P. K. Behera,A. Bożek,Masaru Yokoyama,H. X. Yang,M. Różańska,E.M. Heenan,A. Matyja,P. Pakhlov,Shingo Suzuki,T. Abe,F. Ohno,H. Yuta,K. Hasuko,A. Gordon,R. Seuster,J. Li,J. Yashima,C.H. Wang,K. Hara,K. Ueno,H. Hayashii,L. Y. Dong,A. Limosani,S. Uno,Y. Watanabe,F. J. Ronga,P. Yeh,Y. Sakai,J. Haba,T. Yamanaka,S. Korpar,Sw. Banerjee,A. Bay, P. Križan,K. Inami,D. Mohapatra,S. Ogawa,Gobinda Majumder,M. E. Sevior,O. Schneider,Daniel Marlow,T. Aushev,N. Kawamura,N. Kent,S. Matsumoto,V. A. Sidorov,M. Satapathy,H. Nakazawa,K. Sumisawa,E. Won,T. Higuchi,L. E. Piilonen,F. Handa,Bruce Yabsley,S.-W. Lin,N. Tamura,J. Schümann,H. Sagawa,J. S. Kang,W. Ostrowicz,I. Bizjak,N. Parslow,N. Soni,T. Tsukamoto,M. Bračko,Hyun-woo Kim,Z. Natkaniec,V. Aulchenko,Hirofumi Fujii,J. Kaneko,T. Hokuue,H.C. Huang,K. Kinoshita,N. Root,M.Z. Wang,Makoto Tomoto,H. Yamamoto,Y. Igarashi,I. Adachi,G.N. Taylor,Hiroshi Matsumoto,V. Eiges,K. Senyo,K. Neichi,H. Miyata,C. Hagner,R. Kagan,G. Leder,Y. Unno,H. Sakaue,K. Korotushenko,J.G. Wang,P. Chang,Abe R,Y. Hoshi,R. Chistov,D. Zürcher,M. Watanabe,O. Tajima,T. Okabe,Yukiko Yamada,K. Tanabe,B. Takeshita,Y. Settai,T. Sarangi,V. Siegle,Keníchi Takahashi,A. Kusaka,Masami Iwamoto,J. B. Singh,Y. Mikami,S. Eidelman,G. Gokhroo,C.W. Park,M. Dash,M. Yamauchi,Yutaka Tamai,S.U. Kataoka,Y. Enari,M. Nakao,T. Matsuishi,I. Higuchi,H. Aihara,H.J. Kim,Y. Ban,I. Bedny,M. Starič,T. Aso,A. Sugi,C. Schwanda,T. Nozaki,K. Tamai,H. Pałka,Y. Teramoto,Yee Hsiung,T. Kawasaki,A. Sugiyama,M. Pernicka,M. Kataoka,R.-S. Lu,T. Matsubara,J.-P. Perroud,T. E. Browder,N. Gabyshev,Y. Ushiroda,W.-S. Hou,A. Drutskoy,P. Krokovny,S. Mori,Z.M. Zhu,K. Abe,C.W. Everton,Byoung Sup Ahn,A. Satpathy,W. Mitaroff,L.S. Peak,S. Noguchi,S. Schrenk,S. Tokuda,C. Fukunaga,Y. Nagasaka,M. Grosse Perdekamp,Yasunari Harada,H. Guler,T. Nagamine,A. Bondar,H. Kawai,T. Matsumoto,A. Tchouvikov,Kevin Varvell,C.C. Zhang,G. Varner,E. Kurihara,H. Iwasaki,A. Kibayashi,Kenta Uchida,L.C. Moffitt,O. Nitoh,J. Dragic,A. M. Bakich,Suyong Choi,Haruo Yanai,T. Tomura,T. Shibata,K. Trabelsi,P. Kapusta,K. Miyabayashi,Heejong Kim,Seema Bahinipati,T. Ziegler,Y. Yusa,Naoya Abe,R. Itoh,L. Widhalm,J.H. Kim,Hyejin Jang,F. Fang,Y. Iwasaki,T.H. Kim,M. Danilov,S. Narita,M.-C. Chang,C.C. Wang,S.K. Swain,Hiroyuki Kawai,E. Banaś,J.H. Kang,Y. Kawakami,A. Kuzmin,Y. Yuan,E.A. Dodson,P. Koppenburg,T. Seki,L. Hinz,T. Hojo,H. Sakamoto,S.N. Tovey,M. Hazumi,E. Nakano,T. Lesiak,S. Nishida,Y. Zheng,K.S. Park,T. Nakadaira,B. Shwartz,Atsushi Yamaguchi,Y. Yamashita,T. Hara,H.O. Kim,A. Garmash,S.K. Kim,N. C. Hastings,F. Mandl,J. Mueller,T. Ohshima,G.F. Moorhead,J. MacNaughton,H. Ozaki,Akira Murakami,S. Semenov,Y. Onuki,T. Gershon,N. Uozaki
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Key words
Half-life Measurements
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