Convolutional Neural Network Denoising of Focused Ion Beam Micrographs

Most research on deep learning algorithms for image denoising has focused on signal-independent additive noise. Focused ion beam (FIB) microscopy with direct secondary electron detection has an unusual Neyman Type A (compound Poisson) measurement model, and sample damage poses fundamental challenges in obtaining training data. Model-based estimation is difficult and ineffective because of the nonc...