Increase of Reverse Leakage Current at Homoepitaxial GaN P-N Junctions Induced by Continuous Forward Current StressTetsuo Narita,Yoshitaka Nagasato,Masakazu Kanechika,Takeshi Kondo,Tsutomu Uesugi,Kazuyoshi Tomita,Satoshi Ikeda,Satoshi Yamaguchi,Yasuji Kimoto,Masayoshi Kosaki,Tohru Oka,Jun Kojima,Jun SudaAPPLIED PHYSICS LETTERS（2021）引用 12|浏览14AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
