Evaluation of Radiation Hardness of Semiconductor Materials Against Alpha Particles for an API Detector

Gabriele Giacomini,Gabriella Carini, Matt Coventry, Mieczyslaw Dabrowski,Connie-Rose Deane,Alfred DellaPenna,Lorenzo Fabris,Grzegorz W. Deptuch,Sven Herrmann,Brian Jurczyk,James Kierstead,Ivan Kotov,Seth McConchie,Erik Muller,Giovanni Pinaroli,Donald Pinelli

2020 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)（2020）

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Key words

alpha interactions,pixelated API detector,semiconductor detector,alpha particles,radiation hardness,alpha flux,semiconductor material,Associated Particle Imaging system,high vacuum chamber,alpha position,API systems,semiconductor-based API detector,current-sensitive preamplifier boards,electron volt energy 5.0 MeV

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