Multiple Scattering of Channeled and Non-Channeled Positively Charged Particles in Bent Monocrystalline Silicon
Scandale W.,Arduini G.,Cerutti F.,Esposito L. S.,Garattini M.,Gilardoni S.,Losito R.,Masi A.,Mirarchi D.,Montesano S.,Redaelli S.,Rossi R.,Smirnov G.,Burmistrov L.,Dubos S.,Puill V.,Stocchi A.,Bandiera L.,Guidi V.,Mazzolari A., Romangnoni M.,Murtas F.,Addesa F. M.,Cavoto G.,Iacoangeli F.,Galluccio F.,Afonin A. G.,Chesnokov Yu. A.,Durum A. A.,Maisheev V. A.,Sandomirskiy Yu. E.,Yanovich A. A.,Kovalenko A. D.,Taratin A. M.,Denisov A. S.,Gavrikov Yu. A.,Ivanov Yu. M., Maliarenko L. G.,Borg J.,James T.,Hall G.,Pesaresi M. The European Physical Journal Plus（2022）
Key words
silicon,multiple scattering,particles,non-channeled
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