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Characterization of Heavily Irradiated Dielectrics for Pixel Sensors Coupling Insulator Applications

S. Bharthuar,M. Golovleva,M. Bezak,E. Bruecken, A. Gaedda,J. Haerkoenen,A. Karadzhinova-Ferrer,N. Kramarenko,S. Kirschenmann,P. Koponen,P. Luukka,K. Mizohata,J. Ott,E. Tuominen

Frontiers in materials（2022）

Cited 1|Views5
Key words
AC-pixel sensors,MOS capacitor,MOSFET,radiation hardness,alumina,hafnia,ALD (atomic layer deposition),magnetic Czochralski
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