Analytical electron microscopy of ( 2 ¯ 01) β-Ga2O3/SiO2 and ( 2 ¯ 01) β-Ga2O3/Al2O3 interface structures in MOS capacitorsChristopher J. Klingshirn,Asanka Jayawardena,Sarit Dhar,Rahul P. Ramamurthy,Dallas Morisette,Tsvetanka Zheleva,Aivars Lelis,Lourdes G. Salamanca-RibaJournal of Applied Physics(2021)引用 3|浏览13暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要