X-band Epi-Baw Resonators
Journal of Applied Physics(2022)
摘要
Using epitaxial aluminum nitride (AlN) developed for ultraviolet photonics and high-speed electronics, we demonstrate suspended AlN thin-film bulk acoustic resonators (FBARs) at 9.2 GHz in the X-band (8–12 GHz) of the microwave spectrum. The resonators show a Qmax≈614 and a figure of merit f⋅Q≈5.6 THz. The material stack of these epi-AlN FBARs allows monolithic integration with AlN/GaN/AlN quantum well high-electron-mobility-transistors to a unique RF front end and also enable integration with epitaxial nitride superconductors for microwave filters for quantum computing.
更多查看译文
关键词
Thin Film Resonators,Aluminum Nitride Thin Films,Micromechanical Resonators,MEMS Resonators,Acoustic Wave Biosensors
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要