SEL and SEU In-Flight Data From Memories on-board PROBA-II Spacecraft

C. Poivey,R. Harboe-Sørensen,M. Pinto,M. Poizat,N. Fleurinck,K. Grürmann, H. Schmidt

2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)（2022）

Cited 1|Views14

Key words

Single Event Effect (SEE),Single Event Upset (SEU),Single Event Latch-up (SEL),radiation experiment,radiation monitor,Static Random Access Memory (SRAM),technology demonstration,hardness assurance

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