Performance of Almost Edgeless Silicon Detectors in CTS and 3D-Planar Technologies
E. Alagoz,G. Anelli,G. Antchev,V. Avati,V. Bassetti,V. Berardi,V. Boccone,M. Bozzo,E. Brucken,A. Buzzo,M. G. Catanesi,S. Cuneo,C. Da Via,M. Deile,R. Dinapoli,K. Eggert,V. Eremin,F. Ferro,J. Hasi,F. Haug,J. Heino,P. Jarron,J. Kalliopuska,J. Kaspar,C. Kenney,A. Kok,V. Kundrat,K. Kurvinen,R. Lauhakangas,E. Lippmaa,M. Lokajicek, T. Luntama,D. Macina,M. Macri,S. Minutoli,L. Mirabito,H. Niewiadomski,E. Noschis,F. Oljemark,R. Orava,M. Oriunno,K. Osterberg,S. Parker,A. -L. Perrot,E. Radermacher,E. Radicioni,G. Ruggiero,H. Saarikko,A. Santroni,G. Sette,P. Siegrist, J. Smotlacha,W. Snoeys,C. Taylor,S. Watts,J. Whitmore JOURNAL OF INSTRUMENTATION（2013）
Key words
Particle tracking detectors (Solid-state detectors),Particle tracking detectors
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