Characterizing Semiconductor Devices for All-Electric Aircraft.Abdelrahman Elwakeel,Neville Mcneill,Rafael Pena Alzola,Ravi Kiran Surapaneni,Gowtham Galla,Ludovic Ybanez,Min Zhang,Weijia YuanIEEE ACCESS（2023）引用 3|浏览15关键词Cryogenic,current measurement,double pulse test,IGBT,MOSFETAI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
