Fourier-ring Correlation Resolution for Time-resolved Measurement in Charged Particle Microscopy.

Journal Article Fourier-ring Correlation Resolution for Time-resolved Measurement in Charged Particle Microscopy Get access Oguz Kagan Hitit, Oguz Kagan Hitit Department of Electrical and Computer Engineering, Boston University, Boston, Massachusetts, USADepartment of Electrical & Electronics Engineering, Koç University, Rumelifeneri, Istanbul, Turkey Search for other works by this author on: Oxford Academic Google Scholar Akshay Agarwal, Akshay Agarwal Department of Electrical and Computer Engineering, Boston University, Boston, Massachusetts, USA Corresponding author: akshayag@bu.edu Search for other works by this author on: Oxford Academic Google Scholar Vivek Goyal Vivek Goyal Department of Electrical and Computer Engineering, Boston University, Boston, Massachusetts, USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 29, Issue Supplement_1, 1 August 2023, Pages 730–731, https://doi.org/10.1093/micmic/ozad067.360 Published: 22 July 2023