Highlights of Recent SPIDER Results and Improvements
JOURNAL OF INSTRUMENTATION（2023）
Key words
Ion sources (positive ions, negative ions, electron cyclotron resonance (ECR), electron beam (EBIS)),Plasma generation (laser-produced, RF, x ray-produced),Beam-line instrumentation (beam position and profile monitors, beam-intensity monitors, bunch length monitors),Accelerator modelling and simulations (multi-particle dynamics, single-particle dynamics)
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