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Efficient Mask Characterization Through Automated Contour and Corner Rounding Extraction

Rainer Zimmermann,Joost Bekaert,Mariya Braylovska, Balakumar Baskaran, Vicky Philipsen, Martin Bohn, Michael Bachmann,Ulrich Klostermann, Eric Hendrickx,Wolfgang Demmerle

38th European Mask and Lithography Conference (EMLC 2023)(2023)

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