Heterogeneous Integration of High-K Complex-Oxide Gate Dielectrics on Wide Band-Gap High-Electron-mobility TransistorsJongho Ji,Jeong Yong Yang,Sangho Lee,Seokgi Kim,Min Jae Yeom,Gyuhyung Lee,Heechang Shin,Sang-Hoon Bae,Jong-Hyun Ahn,Sungkyu Kim,Jeehwan Kim,Geonwook Yoo,Hyun S. KumCommunications Engineering(2024)引用 1|浏览24AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要