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Beam Diagnostics with Silicon Pixel Detector Array at PADME Experiment

S. Bertelli,F. Bossi,C. Di Giulio,E. Di Meco, K. Dimitrova,R. De Sangro,D. Domenici,A. Frankenthal,F. Ferrarotto,G. Finocchiaro,L. G. Foggetta,M. Garattini,G. Georgiev,P. Gianotti,S. Ivanov,Sv. Ivanov,V. Kozhuharov,E. Leonardi,E. Long, M. Mancini,I. Oceano,F. Oliva,G. C. Organtini,G. Piperno,M. Raggi,I. Sarra,R. Simeonov,T. Spadaro,E. Spiriti,C. Taruggi,E. Vilucchi,P. Valente,A. Variola

JOURNAL OF INSTRUMENTATION（2024）

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关键词
Beam-line instrumentation (beam position and profile monitors,beam-intensity monitors,bunch length monitors),Particle tracking detectors,Analysis and statistical methods,Data processing methods
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