Mechanisms of Negative Bias Instability of Commercial SiC MOSFETs Observed by Current Transients
SOLID-STATE ELECTRONICS（2024）
Key words
Hole trapping,Near-interface traps,Negative bias instability,Silicon carbide MOSFET
AI Read Science
Must-Reading Tree
Example
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined