Deformation Behavior and Degradation on Rutherford Cabling of Nb3Sn Wires

Simon Hopkins, Bentejui Medina-Clavijo, Cristin Rastoll, Davide Rodia, Marina Malabaila,Christian Barth,Jerome Fleiter,Thierry Boutboul,Amalia Ballarino

IEEE Transactions on Applied Superconductivity（2024）

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Critical current density,deformation,image analysis,niobium-tin,scanning electron microscopy,superconducting cables,superconducting wires

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