Real-IAD: A Real-World Multi-View Dataset for Benchmarking Versatile Industrial Anomaly Detection

Chengjie Wang,Wenbing Zhu,Bin-Bin Gao,Zhenye Gan,Jiangning Zhang,Zhihao Gu, Bruce Qian,Mingang Chen,Lizhuang Ma

CVPR 2024（2024）

引用 3|浏览204

关键词

Benchmark,Real-world Datasets,Anomaly Detection,Multi-view Datasets,Industrial Production,Real Scenarios,Practical Value,Application Value,Actual Scenario,Scale Datasets,Training Set,Data Normalization,Results Of Method,Normal Samples,Number Of Images,Production Line,Types Of Defects,Manual Annotation,Pixel Level,Anomaly Detection Methods,Mixed Materials,Memory Bank,Quality Inspection,Noise Samples,Pixel-level Annotations,Abnormal Data,Single View,Visual Learning,Normal Flow

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