Parameter Extraction Using the Transfer Characteristics of Vertically Stacked Si Nanosheet MOSFETsAdelmo Ortiz-Conde,Vanessa C. P. Silva,Anabela Veloso,Paula G. D. Agopian,Simoen Eddy,Joao A. Martino,Francisco J. García-SánchezJournal of Integrated Circuits and Systems（2024）引用 0|浏览12AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
