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Significant Reduction in Sidewall Damage Related External Quantum Efficiency (EQE) Drop in Red InGaN Microleds (∼625 Nm at 1 A Cm-2) with Device Sizes Down to 3 Μm

Surjava Sanyal,Qinchen Lin, Timothy Shih, Shijie Zhang,Guangying Wang,Swarnav Mukhopadhyay,Jonathan Vigen, Wentao Zhang,Shubhra S. Pasayat,Chirag Gupta

JAPANESE JOURNAL OF APPLIED PHYSICS（2024）

Cited 1|Views13
Key words
light emitting diodes,surface recombination,external quantum efficiency,MicroLEDs,red microLED
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