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Numerical Investigation of Ion Back Flow of a Microwave Discharge Ion Thruster

A. Nono, Y. Yamashita,R. Tsukizaki,K. Nishiyama

2023 IEEE International Conference on Plasma Science (ICOPS)(2023)

Cited 0|Views2
Key words
Back Flow,Microwave Discharge,Ion Beam,Cause Of Damage,Particle-in-cell,Testing Ground,Valid Approximation,Functional Ion,Hybrid Particles
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