Characterization of Fragmented Ultra-high Energy Heavy Ion Beam and Its Effects on Electronics Single Event Effect Testing

Mario Sacristan Barbero,Ivan Slipukhin,Matteo Cecchetto,Daniel Prelipcean,Ygor Aguiar,Kacper Bilko,Natalia Emriskova,Andreas Waets,Andrea Coronetti,Maria Kastriotou,Carlo Cazzaniga, Torran Dodd,Frederic Saigne,Vincent Pouget,Ruben Garcia Alia

IEEE TRANSACTIONS ON NUCLEAR SCIENCE（2024）

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Key words

Ions,Testing,Silicon,Detectors,Kinetic energy,Ion beams,Particle beams,Beam fragmentation,FLUktuierende KAskade (FLUKA),heavy-ion beam,Monte Carlo simulations,RADiation facility Network for the EXploration of effects for indusTry and research (RADNEXT),single-event effects (SEEs),solid-state silicon detectors,super proton synchrotron (SPS) north area (NA),static random access memory (SRAM) memories,ultrahigh-energy (UHE) beam

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