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Methods for Proton Direct Ionization SEU Characterization and Orbital Error Rate Estimation

IEEE TRANSACTIONS ON NUCLEAR SCIENCE(2024)

Cited 0|Views9
Key words
Protons,Error analysis,Ionization,Random access memory,Orbits,Particle beams,Extraterrestrial measurements,Low energy proton (LEP),proton beam,proton radiation effects,single event effects,single event upsets (SEUs),soft-error rates
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