Methods for Proton Direct Ionization SEU Characterization and Orbital Error Rate Estimation
IEEE TRANSACTIONS ON NUCLEAR SCIENCE(2024)
Key words
Protons,Error analysis,Ionization,Random access memory,Orbits,Particle beams,Extraterrestrial measurements,Low energy proton (LEP),proton beam,proton radiation effects,single event effects,single event upsets (SEUs),soft-error rates
AI Read Science
Must-Reading Tree
Example

Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined