A Characterization Method for TID Vs Temperature Effects on Microelectronic Circuits
IEEE TRANSACTIONS ON NUCLEAR SCIENCE（2024）
Key words
Co-60,bipolar junction transistor (BJT),bipolar technology,commercial off the shelf (COTS),intra-lot variability,low dropout (LDO) regulator,LT1521,temperature characterization,total ionizing dose (TID),voltage regulator
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