Skipper-in-CMOS: Nondestructive Readout with Subelectron Noise Performance for Pixel Detectors

Agustin J. Lapi,Miguel Sofo-Haro, Benjamin C. Parpillon,Adi Birman,Guillermo Fernandez-Moroni,Lorenzo Rota,Fabricio Alcalde Bessia,Aseem Gupta, Claudio R. Chavez Blanco,Fernando Chierchie,Julie Segal,Christopher J. Kenney,Angelo Dragone,Shaorui Li,Davide Braga,Amos Fenigstein,Juan Estrada,Farah Fahim

IEEE TRANSACTIONS ON ELECTRON DEVICES（2024）

Cited 0|Views5

Key words

Noise,Logic gates,Charge coupled devices,Photonics,Charge transfer,Electrons,Detectors,Transmission line matrix methods,Silicon,Semiconductor device measurement,Multiple nondestructive readout,single photon,skipper charge coupled devices (Skipper-CCDs) in CMOS,subelectron noise

AI Read Science

Must-Reading Tree

Example

Generate MRT to find the research sequence of this paper

Chat Paper

Summary is being generated by the instructions you defined