Total-Dose Induced Threshold Voltage Shift Dependence on Tier Pitch in 3D NAND Flash Memories
IEEE Transactions on Nuclear Science（2024）
Key words
Nonvolatile memory,3-D NAND flash,charge trap devices,radiation effects,total ionizing dose effects,X-rays
AI Read Science
Must-Reading Tree
Example
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined