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Precise Measurement of the 7be Electron Capture Decay Half-Life in Silicon Carbide

C. Santonastaso, N. Casali,L. Di Benedetto, V Boldrini,R. Buompane, M. Canino, V Carrano,A. Formicola,L. Gialanella,M. Laubenstein, H. C. Neitzert, M. Pieruccini,G. Porzio,A. Rubino

JOURNAL OF PHYSICS G-NUCLEAR AND PARTICLE PHYSICS（2025）

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Key words
half-life,electron capture,Be-7
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