Modulating Structural and Dielectric Properties of CrFeO3 Materials Via Ni2+ Substitution: Insights from Rietveld Refinement, Elemental and Spectral Evaluation for High-Frequency Applications
Ceramics International(2025)
Key words
XRD,X-ray Photoelectron Spectroscopy,Infrared spectroscopy,Rietveld Refinement
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