Testbeam Results of Irradiated SiGe BiCMOS Monolithic Silicon Pixel Detector Without Internal Gain Layer
T. Moretti,Matteo Milanesio,R. Cardella,T. Kugathasan,A. Picardi, I. Semendyaev,M. Elviretti, H. Rücker, K. Nakamura,Y. Takubo,M. Togawa,F. Cadoux,R. Cardarelli, C. Colledani, K. Sakashita, N. Giangiacomi,Carlo Alberto Fenoglio,D. Ferrère,S. González-Sevilla,L. Iodice,R. Kotitsa,Chiara Magliocca, S. Němeček,A. Pizarro-Medina,J. Sabater Iglesias,J. Saidi, T. Vickey, G. Della Ricca,L. Paolozzi,G. Iacobucci Journal of Instrumentation（2024）
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